380-keV Ar+-irradiation effects on optical phonons in graphite studied with transient reflection measurement-Reference-Cited by-同舟云学术

380-keV Ar+-irradiation effects on optical phonons in graphite studied with transient reflection measurement

Published:2023-10-03 Issue:13 Volume:134 Page:
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:

Author:

Kimata Tetsuya¹²^ORCID,Kato Taichi¹³,Takagi Itsuki¹³^ORCID,Konno Yuma¹³^ORCID,Okazaki Hiroyuki²^ORCID,Yamamoto Shunya²^ORCID,Yamaki Tetsuya²^ORCID,Nakamura Kazutaka G.¹³^ORCID

Affiliation:

1. Laboratory for Materials and Structures, Institute of Innovative Research, Tokyo Institute of Technology 1 , 4259 Nagatsuta, Yokohama 226-8503, Japan

2. Takasaki Institute for Advanced Quantum Science, National Institutes for Quantum Science and Technology 2 , 1233 Watanuki, Takasaki, Gunma 370-1292, Japan

3. Department of Materials Science and Engineering, Tokyo Institute of Technology 3 , 4259 Nagatsuta, Yokohama 226-8503, Japan

Abstract

In this work, we performed transient reflection measurements using the pump–probe protocol to investigate the influence of lattice defects induced by 380 keV argon (Ar) ions on the phonon dynamics of interlayer shearing (E2g1) and in-plane carbon stretching (E2g2) modes in highly oriented pyrolytic graphite (HOPG). The frequency and decay rate of E2g1- and E2g2-mode phonons were changed significantly at the fluence of 1×1014 ions/cm2. This indicated that significant structural changes in HOPG due to 380 keV Ar-ion irradiation were expressed as changes in the frequency and decay rate of phonons. In HOPG irradiated with 380 keV Ar+ at the fluence of 1×1014 ions/cm2, our measurement results indicated that compressive and tensile stresses contributed to in-plane and interlayer graphite structures, respectively.

Funder

Japan Society for the Promotion of Science

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

https://pubs.aip.org/aip/jap/article-pdf/doi/10.1063/5.0161215/18150066/135306_1_5.0161215.pdf

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