Influence of mechanical noise inside a scanning electron microscope
Author:
Affiliation:
1. AS2M department, FEMTO-ST Institute, Université de Franche-Comté/CNRS/ENSMM, 25000 Besançon, France
Funder
EQUIPEX ROBOTEX
French National Project NANOROBUST
LABEX action
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4917557
Reference25 articles.
1. Inexpensive two-tip nanomanipulator for a SEM
2. Mechanical characterization of nanofibers using a nanomanipulator and atomic force microscope cantilever in a scanning electron microscope
3. Nanomanipulation in a scanning electron microscope
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