Temperature-dependent mechanical deformation of silicon at the nanoscale: Phase transformation versus defect propagation-Reference-Cited by-同舟云学术

Temperature-dependent mechanical deformation of silicon at the nanoscale: Phase transformation versus defect propagation

Published:2015-05-27 Issue:20 Volume:117 Page:205901
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:J. Appl. Phys.

Author:

Kiran M. S. R. N.¹^ORCID,Tran T. T.¹,Smillie L. A.¹,Haberl B.¹²,Subianto D.¹,Williams J. S.¹,Bradby J. E.¹

Affiliation:

1. Department of Electronic Materials Engineering, Research School of Physics and Engineering, Australian National University, Australian Capital Territory, Canberra 2601, Australia

2. Chemical and Engineering Materials Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

Funder

Centre of Excellence for Environmental Decisions, Australian Research Council (Centre of Excellence for Environmental Decisions)

U.S. Department of Energy (Department of Energy)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.4921534

Reference52 articles.

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5. Crystal Structures at High Pressures of Metallic Modifications of Silicon and Germanium

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