Measuring the lateral charge-carrier mobility in metal-insulator-semiconductor capacitors via Kelvin-probe-Reference-Cited by-同舟云学术

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Measuring the lateral charge-carrier mobility in metal-insulator-semiconductor capacitors via Kelvin-probe

Published:2018-01 Issue:1 Volume:89 Page:013902
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Milotti Valeria¹,Pietsch Manuel²,Strunk Karl-Philipp²,Melzer Christian²

Affiliation:

1. Department of Physics and Astronomy, “Galileo Galilei”, University of Padova, Via Marzolo 8, 35131 Padova, Italy

2. Centre for Advanced Materials and Kirchhoff Institut für Physik, Universität Heidelberg, Im Neuenheimer Feld 252, D-69120 Heidelberg, Germany

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5002629

Reference27 articles.

1. Organic Electronics

2. Organic thin-film transistors

3. Adjustable passivation of SiO2 trap states in OFETs by an ultrathin CVD deposited polymer coating

4. Electron trapping in pentacene based p- and n-type organic field-effect transistors

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Rapidly Measuring Charge Carrier Mobility of Organic Semiconductor Films Upon a Point-Contact Four-Probes Method;IEEE Journal of the Electron Devices Society;2019

2. Kelvin-Probe based carrier-mobility extraction reviewed by finite element simulation;Synthetic Metals;2019-01

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