Patterned heteroepitaxial processing applied to ZnSe and ZnS0.02Se0.98 on GaAs (001)
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1446227
Reference19 articles.
1. Nucleation mechanisms and the elimination of misfit dislocations at mismatched interfaces by reduction in growth area
2. Lattice engineered compliant substrate for defect-free heteroepitaxial growth
3. The use of graded InGaAs layers and patterned substrates to remove threading dislocations from GaAs on Si
4. Improvement in heteroepitaxial film quality by a novel substrate patterning geometry
5. Thermal mismatch stress relaxation via lateral epitaxy in selectively grown GaN structures
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