Correlated topographic and spectroscopic imaging beyond diffraction limit by atomic force microscopy metallic tip-enhanced near-field fluorescence lifetime microscopy-Reference-Cited by-同舟云学术

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Correlated topographic and spectroscopic imaging beyond diffraction limit by atomic force microscopy metallic tip-enhanced near-field fluorescence lifetime microscopy

Published:2003-07 Issue:7 Volume:74 Page:3347-3355
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Hu Dehong,Micic Miodrag,Klymyshyn Nicholas,Suh Yung Doug,Lu H. Peter

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1581359

Reference62 articles.

1. Surface Studies by Scanning Tunneling Microscopy

2. Photoassisted scanning tunneling microscopy

3. Surface-enhanced and STM-tip-enhanced Raman Spectroscopy at Metal Surfaces

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4. High-throughput, multi-parametric, and correlative fluorescence lifetime imaging;Methods and Applications in Fluorescence;2020-02-19

5. Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences;Scientific Reports;2020-01-24

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