InP optical constants between 0.75 and 5.0 eV determined by variable‐angle spectroscopic ellipsometry
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.358864
Reference15 articles.
1. Ellipsometric characterization of InP-based quantum well structures
2. Exciton Absorption and Emission in InP
3. Refractive Index of InP
4. Optical properties of In1−xGaxP1−yAsy, InP, GaAs, and GaP determined by ellipsometry
5. Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV
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