Characterization of rf‐sputtered SnOxthin films by electron microscopy, Hall‐effect measurement, and Mössbauer spectrometry
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.346889
Reference26 articles.
1. Tin oxide based gas sensors
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5. Physical Properties of SnO2 Materials: II . Electrical Properties
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