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Ballistic electron emission luminescence

Published:2003-06-23 Issue:25 Volume:82 Page:4498-4500
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Appelbaum Ian,Russell K. J.,Narayanamurti V.,Monsma D. J.,Marcus C. M.,Hanson M. P.,Gossard A. C.,Temkin H.,Perry C. H.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1584524

Reference23 articles.

1. Surface Studies by Scanning Tunneling Microscopy

2. Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy

3. Ballistic electron emission testing of semiconductor heterostructures

4. Theory of ballistic-electron-emission microscopy of buried semiconductor heterostructures

5. Direct Observation of Quasi-Bound States and Band-Structure Effects in a Double Barrier Resonant Tunneling Structure Using Ballistic Electron Emission Microscopy

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical detection of spin-filter effect for electron spin polarimetry;Applied Physics Letters;2014-08-04

2. Probing semiconductor band structures and heterojunction interface properties with ballistic carrier emission:GaAs/AlxGa1−xAsas a model system;Physical Review B;2010-06-24

3. Direct injection tunnel spectroscopy of a p-n junction;Applied Physics Letters;2009-07-13

4. Ballistic electron microscopy and spectroscopy of metal and semiconductor nanostructures;Surface Science Reports;2009-05-01

5. Heterointegrated near-field photodetector for ballistic electron emission luminescence;Journal of Applied Physics;2009-04-15

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