Photo-crystallization in a-Se layer structures: Effects of film-substrate interface-rigidity-Reference-Cited by-同舟云学术

Photo-crystallization in a-Se layer structures: Effects of film-substrate interface-rigidity

Author:

Lindberg G. P.¹,O'Loughlin T.²,Gross N.¹,Mishchenko A.³,Reznik A.³,Abbaszadeh S.⁴,Karim K. S.⁴,Belev G.⁵,Weinstein B. A.¹

Affiliation:

1. SUNY at Buffalo, Department of Physics, Buffalo, New York 14260-1500, USA

2. SUNY at Buffalo, Department of Chemistry, Buffalo, New York 14260, USA

3. Lakehead University, 955 Oliver Road, Thunder Bay, Ontario P7B 5E1, Canada

4. University of Waterloo, Waterloo, Ontario N2L 3G1, Canada

5. University of Saskatchewan, Saskatoon, Saskatchewan S7N 5A9, Canada

Funder

Ontario Research Fund-Research Excellence Program

Canadian Institutes of Health Research (Instituts de recherche en santé du Canada)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

Reference32 articles.

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