Author:
Freeouf J. L.,Braslau N.,Wittmer M.
Subject
Physics and Astronomy (miscellaneous)
Cited by
4 articles.
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1. Microwave method for SOS quality testing;Russian Microelectronics;2008-03
2. SOI Materials Characterization;Silicon-on-Insulator Technology: Materials to VLSI;2004
3. Optically tunable millimeter-wave attenuator based on layered structures;Microwave and Optical Technology Letters;2000
4. SOI Materials Characterization;Silicon-on-Insulator Technology: Materials to VLSI;1997