Signal electronics for an atomic force microscope equipped with a double quartz tuning fork sensor
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2194490
Reference14 articles.
1. 7 × 7 Reconstruction on Si(111) Resolved in Real Space
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4. A low temperature ultrahigh vaccum scanning force microscope
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