An electro-thermal computational study of conducting channels in dielectric thin films using self-consistent phase-field methodology: A view toward the physical origins of resistive switching-Reference-Cited by-同舟云学术

An electro-thermal computational study of conducting channels in dielectric thin films using self-consistent phase-field methodology: A view toward the physical origins of resistive switching

Published:2020-10-28 Issue:16 Volume:128 Page:165302
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Koushan Foroozan S.¹²^ORCID,Kobayashi Nobuhiko P.¹²^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, Jack Baskin School of Engineering, University of California Santa Cruz, Santa Cruz, California 95064, USA

2. Nanostructured Energy Conversion Technology and Research (NECTAR), University of California Santa Cruz, Santa Cruz, California 95064, USA

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0027702

Reference25 articles.

1. Domain Shapes and Patterns: The Phenomenology of Modulated Phases

2. Nanoionics-based resistive switching memories

3. Direct Identification of the Conducting Channels in a Functioning Memristive Device

4. Confining vertical conducting filament for reliable resistive switching by using a Au-probe tip as the top electrode for epitaxial brownmillerite oxide memristive device

5. Resistive Switching by Voltage-Driven Ion Migration in Bipolar RRAM—Part I: Experimental Study

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