Low dark current Sb-based short-wavelength infrared photodetector

Author:

Li Mingming1ORCID,Cheng Yifan1,Zhang Xiangyu2,Zhang Ye2ORCID,Jiang Dongwei23,Song Zhigang13ORCID,Zheng Wanhua13ORCID

Affiliation:

1. Key Laboratory of Solid-State Optoelectronics Information Technology, Institute of Semiconductors, Chinese Academy of Sciences 1 , Beijing, China

2. Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences 2 , Beijing 100083, China

3. Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences 3 , Beijing 100049, China

Abstract

We have theoretically and experimentally demonstrated the feasibility of achieving ultra-low dark current in CpBnn type detectors based on a double-barrier InAs/GaSb/AlSb type-II superlattice. By employing a structure that separates the absorption region and depletion region, the diffusion, recombination, tunneling, and surface dark currents of the photodetector (PD) have been suppressed. Experimental validation has shown that a detector with a diameter of 500 µm at a bias voltage of −0.5 V exhibits a dark current density of 2.5 × 10−6 A/cm2 at the operating temperature of 300 K. The development of PD with low dark current has paved the way for applications with high demands for low noise in the fields of gravitational wave detection and astronomical observation.

Funder

National Key Research and Development Program of China

National Key Technologies R&D Program of China

Major Program of the National Natural Science Foundation of China

The Young Scientists Fund of National Natural Science Foundation of China

The State Key Laboratory of Special Rare Metal Materials

Publisher

AIP Publishing

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