New Developments in Femtosecond Soft X-ray Spectroscopy-Reference-Cited by-同舟云学术

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New Developments in Femtosecond Soft X-ray Spectroscopy

Published:2010 Issue: Volume: Page:
ISSN:0094-243X
Container-title:AIP Conference Proceedings
language:
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Author:

Erko A.,Firsov A.,Holldack K.,Garrett R.,Gentle I.,Nugent K.,Wilkins S.

Publisher

AIP

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Spectrometers and monochromators for femtosecond soft x-ray sources;Advances in X-Ray/EUV Optics and Components XIV;2019-09-09

2. Efficient high-order suppression system for a metrology beamline;Journal of Synchrotron Radiation;2018-01-01

3. Design concept of the high-resolution end-station PEAXIS at BESSY II: Wide-Q-range RIXS and XPS measurements on solids, solutions, and interfaces;Journal of Electron Spectroscopy and Related Phenomena;2016-07

4. The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-II;Journal of Synchrotron Radiation;2016-01-01

5. Femtosecond high-resolution hard X-ray spectroscopy using reflection zone plates;Optics Express;2015-03-30

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