Investigation on nanoscale processes on the BaF2(111) surface in various solutions by frequency modulation atomic force microscopy-Reference-Cited by-同舟云学术

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Investigation on nanoscale processes on the BaF2(111) surface in various solutions by frequency modulation atomic force microscopy

Published:2016-06-07 Issue:21 Volume:119 Page:214308
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Kobayashi Naritaka¹,Kawamura Ryuzo²,Yoshikawa Hiroshi Y.¹²,Nakabayashi Seiichiro¹²

Affiliation:

1. Division of Strategic Research and Development, Graduate School of Science and Engineering, Saitama University, Shimo-okubo 255, Sakura-ku, Saitama 338-8570, Japan

2. Department of Chemistry, Faculty of Science, Saitama University, Shimo-okubo 255, Sakura-ku, Saitama 338-8570, Japan

Funder

Japan Society for the Promotion of Science (JSPS)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4953233

Reference37 articles.

1. Principles of Lithography

2. New fast scintillators on the base of BaF2 crystals with increased light yield of 0.9ns luminescence for TOF PET

3. Intrinsic birefringence in calcium fluoride and barium fluoride

4. A BaF2 detector array for γ rays up to ∼30MeV

5. Mesoscopic fast ion conduction in nanometre-scale planar heterostructures

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantitative comparison of wideband low-latency phase-locked loop circuit designs for high-speed frequency modulation atomic force microscopy;Beilstein Journal of Nanotechnology;2018-06-21

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