The use of a special work station for in situ measurements of highly reactive electrochemical systems by atomic force and scanning tunneling microscopes
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Published:1999-12
Issue:12
Volume:70
Page:4668-4675
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ISSN:0034-6748
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Container-title:Review of Scientific Instruments
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language:en
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Short-container-title:Review of Scientific Instruments
Author:
Cohen Yair,Aurbach Doron
Cited by
38 articles.
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