Atomic steps with tuning-fork-based noncontact atomic force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.124780
Reference13 articles.
1. Shallow ripples with giant wavelengths observed by atomic force microscopy: Real effects and the report of a new artifact
2. Piezoelectric tip‐sample distance control for near field optical microscopes
3. Dynamic behavior of tuning fork shear-force feedback
4. Probe‐surface interaction in near‐field optical microscopy: The nonlinear bending force mechanism
5. Near-contact mode: a novel AFM operation mode for nondestructive ultrahigh lateral-resolution topography measurement in air
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