Performance analysis of a digital capacitance measuring circuit-Reference-Cited by-同舟云学术

Performance analysis of a digital capacitance measuring circuit

Published:2015-05 Issue:5 Volume:86 Page:054703
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Xu Lijun¹,Sun Shijie¹^ORCID,Cao Zhang¹^ORCID,Yang Wuqiang²

Affiliation:

1. Key Laboratory of Ministry of Education for Precision Opto-Mechatronics Technology, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing 100191, China

2. School of Electrical and Electronic Engineering, University of Manchester, Sackville Street, Manchester M13 9PL, United Kingdom

Funder

National Natural Science Foundation of China (NSFC)

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4919907

Reference22 articles.

1. Practical and simple circuitry for the measurement of small capacitance

2. An impedance measurement of a small‐capacitance circuit using transient responses for lightning surge analysis

3. Capacitance–Voltage Measurement Method for Ultrathin Gate Dielectrics Using LC Resonance Circuit

4. Weak-Inversion Measurement Circuit for Miniature Electrical Capacitance Tomography

5. Electrical capacitance tomography using an accelerated proximal gradient algorithm

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