X‐ray photoelectron spectroscopy study on composition and structure of sol‐gel derived PbTiO3thin films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.362805
Reference17 articles.
1. Epitaxial growth and crystallographic analyses of (Pb, La)TiO3thin films by a multi‐ion‐beam reactive cosputtering technique
2. Multi‐ion‐beam reactive sputter deposition of ferroelectric Pb(Zr,Ti)O3thin films
3. Compositional and microstructural characterization of thin film lead zirconate titanate ferroelectrics
4. Crystallization of sol‐gel derived lead zirconate titanate thin films
5. X‐ray photoelectron spectroscopy and Auger electron spectroscopy studies of ferroelectric (Pb,La)TiO3thin films prepared by a multi‐ion‐beam reactive cosputtering technique
Cited by 55 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Directing the photogenerated charge flow in a photocathodic metal protection system with single‐domain ferroelectric PbTiO3 nanoplates;Electron;2024-06-26
2. Pb(II) Uptake from Polluted Irrigation Water Using Anatase TiO2 Nanoadsorbent;Molecules;2023-06-07
3. Stability of ferroelectric phase and structural characteristics in oriented PbTiO3 ceramic coating formed by aerosol deposition method;Applied Physics Letters;2023-04-03
4. Ultra–low loss tangent and giant dielectric permittivity with excellent temperature stability of TiO2 co-doped with isovalent-Zr4+/pentavalent-Ta5+ ions;Journal of Materiomics;2022-11
5. Ag nanoparticles/PbTiO3 with in-situ photocatalytic process and its application in an ultra-sensitive molecularly imprinted hemoglobin detection;Colloids and Surfaces B: Biointerfaces;2022-09
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3