Thickness dependent low-frequency noise characteristics of a-InZnO thin-film transistors under light illumination
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4862318
Reference20 articles.
1. Depth Profiling of Border Traps in MOSFET With High-$kappa$Gate Dielectric by Charge-Pumping Technique
2. Comprehensive study on low-frequency noise and mobility in Si and SiGe pMOSFETs with high-/spl kappa/ gate dielectrics and TiN gate
3. Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics
4. Low-Frequency Noise in Submicrometer MOSFETs With HfO<tex>$_2$</tex>, HfO<tex>$_2/hbox Al_2hbox O_3$</tex>and HfAlO<tex>$_x$</tex>Gate Stacks
5. Modeling of Statistical Low-Frequency Noise of Deep-Submicrometer MOSFETs
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