Impedance characterization of dinaphtho[2,3-b:2’,3’-f]thieno[3,2-b]thiophene diodes: Addressing dielectric properties and trap effects

Author:

Cho Hong-rae1ORCID,Hyung Park Joon1ORCID,Kim Somi1ORCID,Udaya Mohanan Kannan1ORCID,Jung Sungyeop2ORCID,Kim Chang-Hyun3ORCID

Affiliation:

1. School of Electronic Engineering, Gachon University 1 , Seongnam 13120, Republic of Korea

2. Advanced Institute of Convergence Technology, Seoul National University 2 , Suwon 16229, Republic of Korea

3. School of Electrical Engineering and Computer Science, University of Ottawa 3 , Ottawa, Ontario K1N 6N5, Canada

Abstract

Dinaphtho[2,3-b:2’,3’-f]thieno[3,2-b]thiophene (DNTT) is a widely used small-molecular p-type organic semiconductor. Despite the broad availability of high-performance DNTT transistors, there is a lack of investigation into other devices based on this semiconductor. In this study, rectifying diodes with DNTT as a single transport medium are fabricated and characterized. Realizing unipolar current rectification from asymmetric metal contacts, a number of physical and electrical properties of DNTT are made accessible. Current–voltage measurement, broad-band impedance spectroscopy, drift-diffusion simulation, and equivalent-circuit modeling are combined to quantify important parameters such as dielectric constant, trap energy, and lifetime. These results provide a practical reference for the design and optimization of diverse electronic devices incorporating DNTT.

Funder

National Research Foundation of Korea

Natural Sciences and Engineering Research Council of Canada

Publisher

AIP Publishing

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