Low energy secondary electron induced damage of condensed nucleotides-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Low energy secondary electron induced damage of condensed nucleotides

Published:2019-05-28 Issue:20 Volume:150 Page:204709
ISSN:0021-9606
Container-title:The Journal of Chemical Physics
language:en
Short-container-title:J. Chem. Phys.

Author:

McKee A. D.¹^ORCID,Schaible M. J.¹,Rosenberg R. A.²,Kundu S.¹,Orlando T. M.¹³^ORCID

Affiliation:

1. School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, Georgia 30332, USA

2. Advanced Photon Source, Argonne National Laboratory, Lemont, Illinois 60439, USA

3. School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, USA

Funder

U.S. Department of Energy

Publisher

AIP Publishing

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.5090491

Reference62 articles.

1. Resonant Formation of DNA Strand Breaks by Low-Energy (3 to 20 eV) Electrons

2. Electron-Stimulated Desorption of H- from Condensed-Phase Deoxyribose Analogues: Dissociative Electron Attachment versus Resonance Decay into Dipolar Dissociation

3. Inelastic electron interaction (attachment/ionization) with deoxyribose

4. Low energy electron attachment to the nucleotide deoxycytidine monophosphate: direct evidence for the molecular mechanisms of electron-induced DNA strand breaks

5. Understanding the Interaction between Low-Energy Electrons and DNA Nucleotides in Aqueous Solution

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effects of low-dose gamma radiation on DNA measured using a quartz tuning fork sensor;Journal of King Saud University - Science;2024-10

2. Investigations of In2O3 Added SiC Semiconductive Thin Films and Manufacture of a Heterojunction Diode;Nanomaterials;2024-05-19

3. How a Single 5 eV Electron Can Induce Double-Strand Breaks in DNA: A Time-Dependent Density Functional Theory Study;The Journal of Physical Chemistry B;2024-04-23

4. Electron beams near surfaces: the concept of partial intensities for surface analysis and perspective on the low energy regime;Frontiers in Materials;2023-06-15

5. Electron scattering with ethane adsorbed on rare gas multilayers: Hole transfer, coulomb decay, and ion dissociation;The Journal of Chemical Physics;2023-03-28

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3