Invited Article: Characterization of background sources in space-based time-of-flight mass spectrometers-Reference-Cited by-同舟云学术

Invited Article: Characterization of background sources in space-based time-of-flight mass spectrometers

Published:2014-09 Issue:9 Volume:85 Page:091301
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Gilbert J. A.¹,Gershman D. J.¹,Gloeckler G.¹,Lundgren R. A.¹,Zurbuchen T. H.¹,Orlando T. M.²,McLain J.²,von Steiger R.³

Affiliation:

1. Department of Atmospheric, Oceanic and Space Sciences, University of Michigan, 2455 Hayward St, Ann Arbor, Michigan 48109, USA

2. Georgia Institute of Technology, 225 North Ave NW, Atlanta, Georgia 30332, USA

3. International Space Science Institute, Hallerstrasse 6, CH-3012 Bern, Switzerland and Physikalisches Institut, Universität Bern, Sidlerstrasse 5, CH-3012 Bern, Switzerland

Funder

National Aeronautics and Space Administration (NASA)

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4894694

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1. Determination of low-energy ion-induced electron yields from thin carbon foils

2. Energy loss of 1–50keV H, He, C, N, O, Ne, and Ar ions transmitted through thin carbon foils

3. Charge state of ∼1 to 50 keV ions after passing through graphene and ultrathin carbon foils

4. The Energetic Particle and Plasma Spectrometer Instrument on the MESSENGER Spacecraft

5. Rosina – Rosetta Orbiter Spectrometer for Ion and Neutral Analysis

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