High-energy electron injection in top-gated niobium microbridges for enhanced power efficiency and localized control

Author:

Du Hongmei12,Xu Zuyu3ORCID,Zhang Ping12,Li Dingding1,Wei Zihan2,Wang Zixi1,Hou Shoucheng1,Chen Benwen1,Liu Tao1,Liu Ruxin1,Lyu Yang-Yang1ORCID,Sun Hancong2ORCID,Wang Yong-Lei12ORCID,Wang Huabing12ORCID,Wu Peiheng12ORCID

Affiliation:

1. Research Institute of Superconductor Electronics, School of Electronic Science and Engineering, Nanjing University 1 , Nanjing 210023, China

2. Purple Mountain Laboratories 2 , Nanjing 211111, China

3. School of Integrated Circuits, Anhui University 3 , Hefei, Anhui 230601, China

Abstract

This study explores gate-controlled superconductivity in metallic superconductors by employing a top-gate architecture with a 15 nm monocrystalline h-BN as a gate dielectric. The transport properties under gate voltage can be elucidated by injecting high-energy electrons, following the Fowler–Nordheim electron field emission model. In contrast to conventional resistive Joule heating, high-energy electron injection with top-gating exhibits excellent power efficiency in suppressing superconductivity. A nearby superconducting bridge, which serves as a thermometer, indicates that our top-gate device can achieve good local control, well limited within a distance of 0.6 μm due to the very low top-gating power. These findings are essential for advancing efficient and highly integrated tunable superconducting electronic devices.

Funder

National Key Research and Development Program of China

National Natural Science Foundation of China

Jiangsu Key Laboratory of Advanced Techniques for Manipulating Electromagnetic Waves

COST Action CA21144 SuperQumap

Publisher

AIP Publishing

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