Comment on ‘‘Inverse problem for the nonexponential deep level transient spectroscopy analysis in semiconductor materials with strong disorder: Theoretical and computational aspects’’ [J. Appl. Phys.74, 291 (1993)]
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.356466
Reference9 articles.
1. Inverse problem for the nonexponential deep level transient spectroscopy analysis in semiconductor materials with strong disorder: Theoretical and computational aspects
2. A constrained regularization method for inverting data represented by linear algebraic or integral equations
3. CONTIN: A general purpose constrained regularization program for inverting noisy linear algebraic and integral equations
4. A reliable and fast method for the solution of Fredhol integral equations of the first kind based on Tikhonov regularization
5. Spectral Analysis of Deep Level Transient Spectroscopy (SADLTS)
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. General analytic solution to the Shockley-Read-Hall rate equations with a single-level defect;Physical Review B;2002-06-19
2. Two‐dimensional approach for solving the inverse problem for deep level transient spectroscopy;Journal of Applied Physics;1995-08
3. Response to ‘‘Comment on ‘Inverse problem for the nonexponential deep level transient spectroscopy analysis in semiconductor materials with strong disorder: Theoretical and computational aspects’ ’’ [J. Appl. Phys.75, 1242 (1994)];Journal of Applied Physics;1994-01-15
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