Electromigration-induced failure of single layered NiFe Permalloy thin films for a giant magnetoresistive read head
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1389337
Reference12 articles.
1. High K/sub u/ materials approach to 100 Gbits/in/sup 2/
2. High current density measurements of giant magnetoresistive spin-valves for magnetic recording and sensor applications
3. Size and self-field effects in giant magnetoresistive thin-film devices
4. Activation energy of interdiffusion and interface structure for CoFe/Cu spin-valves
5. DIRECT TRANSMISSION ELECTRON MICROSCOPE OBSERVATION OF ELECTROTRANSPORT IN ALUMINUM THIN FILMS
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1. Hall effect-induced acceleration of electromigration failures in spin valve multilayers under magnetic field;Applied Physics Letters;2011-04-18
2. Effects of controlling Cu spacer inter-diffusion by diffusion barriers on the magnetic and electrical stability of GMR spin-valve devices;Journal of Magnetism and Magnetic Materials;2010-07
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5. Electrical reliability of tunneling magnetoresistive read heads;Journal of Applied Physics;2003
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