Low-temperature evolution of local polarization properties of PbZr0.65Ti0.35O3 thin films probed by piezoresponse force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4869147
Reference28 articles.
1. Local polarization dynamics in ferroelectric materials
2. Domain Wall Creep in Epitaxial FerroelectricPb(Zr0.2Ti0.8)O3Thin Films
3. Depolarizing-field-mediated 180° switching in ferroelectric thin films with 90° domains
4. Quantitative analysis of nanoscale switching in SrBi2Ta2O9 thin filmsby piezoresponse force microscopy
5. Scanning Nonlinear Dielectric Microscopy Nano-Science and Technology for Next Generation High Density Ferroelectric Data Storage
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