Electrical characterization and Auger depth profiling of nanogap electrodes fabricated by I2-assisted focused ion beam
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2364833
Reference19 articles.
1. Controlled fabrication of metallic electrodes with atomic separation
2. Conductance of a Molecular Junction
3. Nanomechanical oscillations in a single-C60 transistor
4. Focused ion beam technology and applications
5. Focused ion-beam patterning of nanoscale ferroelectric capacitors
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