Composition limited hydrogen effusion rate of a-SiNx:H passivation stack
Author:
Publisher
AIP Publishing
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5123853
Reference19 articles.
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4. Influence of Hydrogen on the Mechanism of Permanent Passivation of Boron–Oxygen Defects in p-Type Czochralski Silicon
5. Investigations on the long time behavior of the metastable boron–oxygen complex in crystalline silicon
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