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Chaos: The speed limiting phenomenon in dynamic atomic force microscopy

  • Published:2017-12-14 Issue:22 Volume:122 Page:224306
  • ISSN:0021-8979
  • Container-title:Journal of Applied Physics
  • language:en
  • Short-container-title:Journal of Applied Physics

Author:

Keyvani Aliasghar12ORCID,Alijani Farbod1ORCID,Sadeghian Hamed23ORCID,Maturova Klara2,Goosen Hans1ORCID,van Keulen Fred1

Affiliation:

1. Department of Precision and Microsystems Engineering, Delft University of Technology, Delft, The Netherlands

2. Netherlands Organization for Applied Scientific Research, TNO, Delft, The Netherlands

3. Department of Mechanical Engineering, Eindhoven University of Technology, Eindhoven, The Netherlands

Funder

Early Research Program 3D Nanomanufacturing

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Non-Smooth Dynamics of Tapping Mode Atomic Force Microscopy;Journal of Computational and Nonlinear Dynamics;2023-05-04

2. Chaos prediction in trolling mode atomic force microscopy: analytical approach;Microsystem Technologies;2022-11-10

3. Chaos control of an atomic force microscopy model in fractional-order;The European Physical Journal Special Topics;2021-07-26

4. Recent trends in AFM imaging speed and improvement methods;Current Nanoscience;2021-07-15

5. Time Delayed Feedback Control Applied in an Atomic Force Microscopy (AFM) Model in Fractional-Order;Journal of Vibration Engineering & Technologies;2019-08-14
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