A computer program to analyze x‐ray diffraction films
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1144267
Reference11 articles.
1. High precision powder x‐ray diffraction measurements at high pressures
2. Hybrid method for nonlinear least-square problems without calculating derivatives
3. The Convergence of a Class of Double-rank Minimization Algorithms
4. A new approach to variable metric algorithms
5. A family of variable-metric methods derived by variational means
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