Application of the finite‐element method and the finite‐difference method to photothermal inspections
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.362642
Reference6 articles.
1. Thermal waves in materials with linearly inhomogeneous thermal conductivity
2. Proposal for Photothermal Characterization of Boundaries Between Layer and Substrate
3. Theory of microstructural depth profiling by photothermal measurements
4. Investigation of microwave π transitions in cesium beam clocks operated with U‐shapedHplane waveguide cavities
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