Self-passivated freestanding superconducting oxide film for flexible electronics

Author:

Jia Zhuoyue1ORCID,Tang Chi Sin2ORCID,Wu Jing3ORCID,Li Changjian4ORCID,Xu Wanting1ORCID,Wu Kairong1,Zhou Difan1ORCID,Yang Ping2ORCID,Zeng Shengwei35,Zeng Zhigang1ORCID,Zhang Dengsong6ORCID,Ariando Ariando5ORCID,Breese Mark B. H.25ORCID,Cai Chuanbing1ORCID,Yin Xinmao1ORCID

Affiliation:

1. Shanghai Key Laboratory of High Temperature Superconductors, Physics Department, Shanghai University 1 , Shanghai 200444, China

2. The Singapore Synchrotron Light Source (SSLS), National University of Singapore 2 , Singapore 117603, Singapore

3. Institute of Materials Research and Engineering (IMRE), Agency for Science, Technology and Research (A*STAR) 3 , 2 Fusionopolis Way, Innovis 08-03, Singapore 138634, Republic of Singapore

4. Department of Materials Science and Engineering, Southern University of Science and Technology 4 , Shenzhen, Guangdong 518055, China

5. Department of Physics, Faculty of Science, National University of Singapore 5 , Singapore 117551, Singapore

6. International Joint Laboratory of Catalytic Chemistry, College of Sciences, Shanghai University 6 , Shanghai 200444, China

Abstract

The integration of high-temperature superconducting YBa2Cu3O6+x (YBCO) into flexible electronic devices has the potential to revolutionize the technology industry. The effective preparation of high-quality flexible YBCO films therefore plays a key role in this development. We present a novel approach for transferring water-sensitive YBCO films onto flexible substrates without any buffer layer. Freestanding YBCO film on a polydimethylsiloxane substrate is extracted by etching the Sr3Al2O6 sacrificial layer from the LaAlO3 substrate. In addition to the obtained freestanding YBCO thin film having a Tc of 89.1 K, the freestanding YBCO thin films under inward and outward bending conditions have Tc of 89.6 and 88.9 K, respectively. A comprehensive characterization involving multiple experimental techniques, including high-resolution transmission electron microscopy, scanning electron microscopy, Raman, and x-ray absorption spectroscopy, is conducted to investigate the morphology, structural, and electronic properties of the YBCO film before and after the extraction process where it shows the preservation of the structural and superconductive properties of the freestanding YBCO virtually in its pristine state. Further investigation reveals the formation of a YBCO passivated layer serves as a protective layer that effectively preserves the inner section of the freestanding YBCO during the etching process. This work plays a key role in actualizing the fabrication of flexible oxide thin films and opens up new possibilities for a diverse range of device applications involving thin-films and low-dimensional materials.

Funder

Key Research Program of Frontier Science, Chinese Academy of Sciences

Foundation for Innovative Research Groups of the National Natural Science Foundation of China

Science and Technology Innovation Plan Of Shanghai Science and Technology Commission

Institute of Materials Research and Engineering

SERC central Research Fund

NUS Emerging Scientist Fellowship

National Key R&D Program of China

Publisher

AIP Publishing

Subject

General Physics and Astronomy

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