Correlation between structural phase transition and surface chemical properties of thin film SrRuO3/SrTiO3 (001)

Author:

Kim Dongwoo1,Lim Hojoon1,Ha Sung Soo2ORCID,Seo Okkyun3,Lee Sung Su2,Kim Jinwoo4,Kim Ki-jeong4,Perez Ramirez Lucia5,Gallet Jean-Jacques56,Bournel Fabrice56,Jo Ji Young2,Nemsak Slavomir7,Noh Do Young1,Mun Bongjin Simon1ORCID

Affiliation:

1. Department of Physics and Photon Science, Gwangju Institute of Science and Technology, Gwangju 61005, South Korea

2. School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju 61005, South Korea

3. Synchrotron X-ray Station at SPring-8, Research Network and Facility Services Division, National Institute for Materials Science (NIMS), Kouto, Sayo, Hyogo 679-5148, Japan

4. Pohang Accelerator Laboratory, POSTECH, 127 Jigok-ro, Nam-gu, Pohang-si, Gyeongsangbuk-do 37673, South Korea

5. Sorbonne Université, CNRS, Laboratoire de Chimie Physique Matière et Rayonnement, UMR 7614, Campus Pierre et Marie Curie, 4 place Jussieu, 75252 Paris Cedex 05, France

6. Synchrotron SOLEIL, L’Orme des Merisiers, Saint-Aubin, F-91192 Gif-sur-Yvette, France

7. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

Publisher

AIP Publishing

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

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