Scanning probe tips formed by focused ion beams
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1142334
Reference18 articles.
1. Surface Studies by Scanning Tunneling Microscopy
2. Scanning tunneling microscopy
3. Real-space observation of the reconstruction of Au(100)
4. Imaging graphite in air by scanning tunneling microscopy: Role of the tip
5. Imaging of granular high-Tc thin films using a scanning tunnelling microscope with large scan range
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