Evaluation of degradation behavior in quantum dot light-emitting diode with different hole transport materials via transient electroluminescence-Reference-Cited by-同舟云学术

Evaluation of degradation behavior in quantum dot light-emitting diode with different hole transport materials via transient electroluminescence

Published:2021-05-17 Issue:20 Volume:118 Page:203503
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Doe Takahiro¹^ORCID,Kitano Keisuke¹^ORCID,Yamamoto Satoru¹,Yamamoto Masaki¹,Goto Kazuki¹,Sakakibara Yusuke¹,Kobashi Tadashi¹,Yamada Hirohisa¹,Ueda Masaya¹,Ryowa Tatsuya¹,Izumi Makoto¹,Arakawa Yasuhiko²^ORCID

Affiliation:

1. Life and Environment Solution Laboratories, Corporate Research and Development BU, SHARP Corporation, 2613-1 Ichinomotocho, Tenri, Nara 632-8567, Japan

2. Institute for Nano Quantum Information Electronics, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan

Funder

New Energy and Industrial Technology Development Organization

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0041689

Reference20 articles.

1. Visible quantum dot light-emitting diodes with simultaneous high brightness and efficiency

2. Blue Quantum Dot Light-Emitting Diodes with High Electroluminescent Efficiency