Investigation on electrical tree propagation in polyethylene based on etching method-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Investigation on electrical tree propagation in polyethylene based on etching method

Published:2017-11 Issue:11 Volume:7 Page:115012
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Shi Zexiang¹,Zhang Xiaohong¹,Wang Kun¹,Gao Junguo¹,Guo Ning¹

Affiliation:

1. Key Laboratory of Engineering Dielectrics and its Application, Ministry of Education, Harbin University of Science and Technology, Harbin, Heilongjiang 150080, China and College of Electrical and Electronic Engineering, Harbin University of Science and Technology, Harbin, Heilongjiang 150080, China

Funder

National Natural Science Foundation of China

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4994941

Reference12 articles.

1. Electrical tree and deteriorated region in polyethylene

2. TEM Observation of Electrical Tree Paths and Microstructures in Polyethylene

3. The influence of morphology on electrical tree initiation in polyethylene under AC and impulse voltages

4. An improved permanganic etchant for polyolefines

5. Direct Evidence of Regimes I, II, and III in Linear Polyethylene Fractions As Revealed by Spherulite Growth Rates

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of nucleating agents on the electrical properties of cross‐linked polyethylene under tensile stress;High Voltage;2023-12-22

2. Trap and carrier removal study of 4J InGaP/InGaAs-GaAsP MQW/InGaAsNSb/Ge high efficient space solar cell using advanced physical models;Physica E: Low-dimensional Systems and Nanostructures;2021-10

3. Effect of sPP Content on Electrical Tree Growth Characteristics in PP-Blended Cable Insulation;Materials;2020-11-26

4. Enhanced breakdown strength and electrical tree resistance properties of MMT/SiO2 /LDPE multielement composites;Journal of Applied Polymer Science;2019-01-03

5. Degradation analysis of 3J InGaP/InGaAs/InGaAsN solar cell due to irradiation induced defects with a comparative study on bottom homo and hetero InGaAsN subcell;Solar Energy;2018-11

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3