Surface stress variation as a function of applied compressive stress and temperature in microscale silicon
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4892623
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1. Shape Memory and Pseudoelasticity in Metal Nanowires
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4. First-principles study of the Young’s modulus of Si ⟨001⟩ nanowires
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