Scattering Phenomena in Electron Microscope Image Formation
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1700023
Reference12 articles.
1. Method of Measuring Spherical Aberration of an Electron Microscope Objective
2. The Magnetic Electron Microscope Objective: Contour Phenomena and the Attainment of High Resolving Power
3. Objective Aperture System for the Electron Microscope
4. Der Einfluß der Strahlspannung auf das übermikroskopische Bild
5. SOME REMARKS ON THE IMAGE CONTRAST IN ELECTRON MICROSCOPY AND THE TWO-COMPONENT OBJECTIVE
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