X‐ray diffraction determination of stress in magnetron‐sputtered Permalloy films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.340850
Reference16 articles.
1. Stress and Magnetic Anisotropy in Thin Permalloy Films
2. An investigation into the effects of oxygen on the magnetic and structural properties of NiFe thin films evaporated onto glass substrates
3. The effect of substrate temperature on the magnetic and structural properties of Ni-Fe thin films deposited in ultrahigh and ordinary vacuum
4. The magnetoresistance, resistivity and stress in Ni-Fe films evaporated in ultrahigh vacuum
5. Magnetic, structural and magnetoresistive properties of magnetron-sputtered thin NiFe films
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Structural modifications of thin magnetic Permalloy films induced by ion implantation and thermal annealing: A comparison;Acta Materialia;2014-08
2. Focused ion beam induced structural modifications in thin magnetic films;Journal of Applied Physics;2012-08
3. Characterization of ion beam and magnetron sputtered thin Ta/NiFe films;Journal of Applied Physics;1999-04-15
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