Material analysis with ion beams

Author:

Ziegler James F.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Reference3 articles.

1. Proceedings of the International Conference on Modern Trends in Activation Analysis, in J. Radioanal. Chem.16, no. 2 (1973). JRACBN0022-4081

2. New precision technique for measuring the concentration versus depth of hydrogen in solids

3. Depth distribution profiling of deuterium and 3He

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3. Compaction of Fullerite Films after High Fluence Ion and Electron Bombardment;Fullerene Science and Technology;1997-04

4. Rutherford backscattering spectrometry for the analysis of atmospheric aerosols;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09

5. A Study on the Bombardment of Fast H+ on Aluminium Surface;Transactions of the Japan Institute of Metals;1980

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