Full-field Fourier ptychography (FFP): Spatially varying pupil modeling and its application for rapid field-dependent aberration metrology-Reference-Cited by-同舟云学术

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Full-field Fourier ptychography (FFP): Spatially varying pupil modeling and its application for rapid field-dependent aberration metrology

Published:2019-05 Issue:5 Volume:4 Page:050802
ISSN:2378-0967
Container-title:APL Photonics
language:en
Short-container-title:APL Photonics

Author:

Song Pengming¹,Jiang Shaowei²,Zhang He²,Huang Xizhi²³,Zhang Yongbing³,Zheng Guoan¹²^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA

2. Department of Biomedical Engineering, University of Connecticut, Storrs, Connecticut 06269, USA

3. Shenzhen Key Lab of Broadband Network and Multimedia, Graduate School at Shenzhen, Tsinghua University, Shenzhen, Guangdong 518055, China

Funder

National Science Foundation

National Institute of Biomedical Imaging and Bioengineering

Publisher

AIP Publishing

Subject

Computer Networks and Communications,Atomic and Molecular Physics, and Optics

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5090552

Reference35 articles.

1. Evaluation of Large Aberrations Using a Lateral-Shear Interferometer Having Variable Shear

2. A wavefront shearing interferometer

3. Measurement of the three-dimensional microscope point spread function using a Shack-Hartmann wavefront sensor

4. The adaptive Shack–Hartmann sensor

5. Wavefront aberrations measured with Hartmann-Shack sensor in patients with keratoconus

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1. Hybrid adaptive step-size strategy for full field of view measurement of ultraviolet Fourier ptychographic microscopy;Optics & Laser Technology;2025-01

2. Anisotropic regularization for sparsely sampled and noise-robust Fourier ptychography;Optics Express;2024-06-27

3. Toward robust super-resolution imaging: A low-rank approximation approach for pattern-illuminated Fourier ptychography;APL Photonics;2024-06-01

4. Towards Full Field-of-View Fourier Ptychography for Extreme Ultraviolet Microscope;2024 IEEE Conference on Computational Imaging Using Synthetic Apertures (CISA);2024-05-20

5. Fourier Ptychographic Microscopy 10 Years on: A Review;Cells;2024-02-10

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