Mixed-mode oscillations of an atomic force microscope in tapping mode

Abstract

In the phenomenon of mixed-mode oscillations, transitions between large-amplitude and small-amplitude oscillations may lead to anomalous jitter in the probe of a tapping mode atomic force microscope (TM-AFM) during the scanning process, thereby affecting the accuracy and clarity of the topographical images of the tested sample’s surface. This work delves deeply into various mixed-mode oscillations and the corresponding formation mechanisms in TM-AFM under low-frequency resonant excitation. Through a detailed analysis of bifurcation sets of the fast subsystem, we found that the system’s mixed-mode oscillations encompass the typical two coexisting branches and the novel three coexisting branches of equilibrium point attractors. In the stable case, a certain transition pattern in phase trajectory can be observed involving two jumps and four jumps, switching between quiescent and spiking states. In the bi-stable case, the trajectory undergoes distinct transitions decided by whether to pass through or crossover the middle branch of attractors when bifurcation occurs. By applying basin of attraction and fast–slow analysis methods, we unfold the dynamic mechanism of mixed-mode oscillations with distinct switching patterns. Our research contributes to a better understanding of complex oscillations of TM-AFM and provides valuable insights for improving image quality and measurement precision while mitigating detrimental oscillations.