Direct detection and imaging of low-energy electrons with delta-doped charge-coupled devices
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.122783
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1. In situreflection electron energy loss spectroscopy measurements of low temperature surface cleaning for Si molecular beam epitaxy
2. Quantitative analysis of semiconductor alloy composition during growth by reflection-electron energy loss spectroscopy
3. Determination of Kilovolt Electron Energy Dissipation vs Penetration Distance in Solid Materials
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