Measurement of quantum efficiency of a charge coupled device-Reference-Cited by-同舟云学术

Measurement of quantum efficiency of a charge coupled device

Published:1998-11 Issue:11 Volume:69 Page:3746-3750
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Hashimotodani K.,Toneri T.,Kitamoto S.,Tsunemi H.,Hayashida K.,Miyata E.,Ohtani M.,Asakura R.,Katayama K.,Kohmura T.,Hiraga J.,Katayama H.,Shoho M.,Kinugasa K.,Imayoshi T.,Sumi Y.,Ohono Y.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1149173

Reference15 articles.

1. CCD soft X-ray imaging spectrometer for the ASCA satellite

2. Mapping X-ray absorption fine structure in the quantum efficiency of an X-ray charge-coupled device

3. X-ray CCD calibration for the AXAF CCD Imaging Spectrometer

4. Low energy response of silicon pn-junction detector

5. Calibration of x-ray CCDs with an erect-field grating spectrometer in the 0.2- to 1.5-keV band

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