Direct measurement of trapped and free charge distributions in semiconductors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1649813
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1. Metal—Semiconductor Barrier Height Measurement by the Differential Capacitance Method—One Carrier System
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5. Influence of divergent electric fields on space-charge distribution measurements by elastic methods
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3. Progress and Prospects in PEA Space Charge Measurement Techniques - [Feature Article];IEEE Electrical Insulation Magazine;2008-05
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