Improved description of trapped ions as a modular electromechanical system

Author:

Van Horne N.1ORCID,Mukherjee M.12ORCID

Affiliation:

1. Centre for Quantum Technologies, National University of Singapore 1 , Singapore 117543

2. Institute of Material Research and Engineering, NQFF, Agency for Science, Technology and Research 2 , 2 Fusionopolis Way, Singapore 138634

Abstract

Trapped ions are among the leading candidates for quantum computing technologies. Interfacing ion qubits in separate traps and interfacing ion qubits with superconducting qubits are two of the many challenges to scale up quantum computers. One approach to overcome both problems is to use a conducting wire to mediate the Coulomb interaction between ions in different traps or between ions and superconducting qubits. To this end, a trapped charged particle inducing charge on a conductor has long been modeled as a system of equivalent lumped element electronic components. Our careful consideration reveals two assumptions in the derivation of this model, which are generally unjustified. We explain how these assumptions undermine the model’s validity, and then introduce an improved way to use linear relationships to describe the interaction of trapped ions with nearby conductors. The new method reproduces results equivalent to those of other works that are not based on the circuit element model. This method is targeted for trouble-shooting experimental designs and allows experiments to test and compare the accuracy of different theoretical models.

Funder

Singapore Ministry of Education Academic Research Fund Tier 2 grant

NRF-CRP grant

Publisher

AIP Publishing

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