Rejuvenation of giant electrostrain in doped barium titanate single crystals

Author:

Patterson E. A.1ORCID,Finkel P.1ORCID,Cain M. G.2ORCID,Thompson P.34ORCID,Lucas C.34ORCID,Staruch M.1ORCID

Affiliation:

1. U.S. Naval Research Laboratory 1 , Washington, District of Columbia 20375, USA

2. Electrosciences Ltd. 2 , Farnham, Surrey GU9 9QT, United Kingdom

3. Oliver Lodge Laboratory, Department of Physics, University of Liverpool 3 , Liverpool L69 3BX, United Kingdom and , Grenoble F-38043, France

4. XMaS Beamline, European Synchrotron Radiation Facility 3 , Liverpool L69 3BX, United Kingdom and , Grenoble F-38043, France

Abstract

Engineering materials through the introduction of point defects has resulted in significant advances in semiconductor processing and, more recently, the observation of novel phenomena such as large reconfigurable strains in ferroelectrics as a result of defect dipole complexes. Up to 0.8% strain has been demonstrated in BaTiO3 crystals dilutely doped with iron. However, the defect dipole pinning sites and the corresponding achievable strains are found to degrade as the crystal is electrically cycled as part of the measurement process. The strain degradation rate is dependent on the applied field values but shows an exponential change in materials properties regardless of the electric field. This behavior, plus a change in impedance with number of times cycled, suggests these changes are due to electric field induced oxygen migration—similar to the cause of the resistance degradation effect. Despite this, effective piezoelectric coefficients of over 4700 pm/V were recorded with 1.5 kV/cm fields, one of the largest values for a lead-free piezoelectric material thus far. In addition, the defect dipole-aligned state and the high strains can be repeatably recovered by a subsequent heat treatment step after cycling. Potential paths to exploiting the defect dipole induced effects and large piezoelectric coefficient in these dilutely doped systems are proposed.

Funder

Office of Naval Research

Office of Naval Research Global

Publisher

AIP Publishing

Subject

General Engineering,General Materials Science

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