Measurement of electrostatic potential fluctuation using heavy ion beam probe in large helical device-Reference-Cited by-同舟云学术

Measurement of electrostatic potential fluctuation using heavy ion beam probe in large helical device

Published:2008-10 Issue:10 Volume:79 Page:10F318
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Ido Takeshi,Shimizu Akihiro,Nishiura Masaki,Nakano Haruhisa,Ohshima Shinsuke,Kato Shinji,Hamada Yasuji,Yoshimura Yasuo,Kubo Shin,Shimozuma Takashi,Igami Hiroe,Takahashi Hiromi,Toi Kazuo,Watanabe Fumitake

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2971207

Reference12 articles.

1. 6 MeV heavy ion beam probe on the Large Helical Device

2. Present Status in the Development of 6 MeV Heavy Ion Beam Probe on LHD

3. Electrostatic Potential Measurement by Using 6-MeV Heavy Ion Beam Probe on LHD

4. Optimization of negative ion sources for a heavy-ion-beam probe

5. Spatial Resolution of the Heavy Ion Beam Probe on LHD

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